Paper
11 April 1997 High-resolution Mueller matrix polarimetry of thin film PLZT electro-optic modulators
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Abstract
A thin-film lead-lanthanum-zirconate-titanate (PLZT) electro-optic spatial light modulator has been characterized with the Mueller matrix imaging polarimeter (MMIP). The MMIP is a dual rotating-retarder polarimeter which illuminates a sample with calibrated polarized states and analyzes the existing polarized state over a spatially-resolved image of the sample images of the retardance magnitude and retardance fast axis orientation reveal the relative electric field strengths in the PLZT 9/65/35 material. By measuring Mueller matrix images of the device at several different applied voltages, a quadratic electro-optic coefficient of 2 X 10-16 (m/V)2 was determined in the modulator active regions.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Elizabeth A. Sornsin and Russell A. Chipman "High-resolution Mueller matrix polarimetry of thin film PLZT electro-optic modulators", Proc. SPIE 3008, Miniaturized Systems with Micro-Optics and Micromechanics II, (11 April 1997); https://doi.org/10.1117/12.271437
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KEYWORDS
Electrodes

Polarization

Polarimetry

Electro optics

Modulators

Electrooptic modulators

Thin films

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