15 April 1997 Atomic force microscopy using small cantilevers
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Abstract
We have applied a new generation of short cantilevers with high resonant frequencies to tapping mode atomic force microscopy of a process in situ. Crystal growth in the presence of protein has been imaged stably at 79 lines/s (1.6 s/image), using a 26 micrometers long cantilever with a spring constant of 0.66 N/m at a tapping frequency of 90.9 kHz. This high scan speed nearly eliminated distortion in the step edge motion and allowed imaging of finer features along the step edges. Atomic force microscopy with short cantilevers therefore allows higher resolution imaging of crystal growth in space as well as time.
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Deron A. Walters, Mario Viani, George T. Paloczi, Tilman E. Schaeffer, Jason P. Cleveland, Mark A. Wendman, Gus Gurley, Virgil B. Elings, Paul K. Hansma, "Atomic force microscopy using small cantilevers", Proc. SPIE 3009, Micromachining and Imaging, (15 April 1997); doi: 10.1117/12.271227; https://doi.org/10.1117/12.271227
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