Translator Disclaimer
15 April 1997 Design and implementation of a metal surface defect image acquisition system
Author Affiliations +
A high speed, high resolution surface defect image acquisition system has been designed and implemented. The system was designed to acquire images of a wide, moving metal surface. The goal of the system is to show the factory operators the location and the shape of surface defects. Since the size of a defect is very small and the area of inspection is very large, a great amount of pixel data should be handled within a short time. In order to achieve this requirement, a large amount of data reduction is needed. The system consists of a set of CCD linescan cameras, a line image processing system, and a workstation. Among the components of the system, lighting and multicamera system are the most important parts. Six high resolution linescan cameras are used to obtain more than twenty thousand pixels per each line. The line image processing unit consists of a camera controller, frame grabbers, and defect image modules. In order to reduce the data drastically, run-length-encoding scheme was used--encoding only the locations of possible defects. These programs were implemented with FPGA chips. We show our implementation details in this paper.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Joon Hee Han and Kyueun Yi "Design and implementation of a metal surface defect image acquisition system", Proc. SPIE 3029, Machine Vision Applications in Industrial Inspection V, (15 April 1997);


Real-time machine vision inspection of plastic bottle closures
Proceedings of SPIE (September 12 1995)
Line-scan inspection of conifer seedlings
Proceedings of SPIE (May 11 1993)
Automatic inspection of pavement cracking distress
Proceedings of SPIE (September 16 2005)
Use of linescan cameras and a DSP processing system for...
Proceedings of SPIE (October 02 1995)

Back to Top