14 February 1997 Moire interferometer applied to a piezoceramic containing a simulated void
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Abstract
In this paper we describe the results of an ongoing experimental program to measure the strain distribution around a simulated void in a piezoceramic material subjected to large electric fields. The simulated void is a two- dimensional circular cylinder fabricated into the sample. Strain information is acquired with a Moire interferometric system which permits both quantitative evaluation of surface strains and qualitative information regarding domain reorientation. Results indicate that large stresses/strains arise around the perimeter of the hole prior to domain reorientation. Domain switching initiates at the locations where the largest stress/strain occurs around the perimeter of the simulated void and do so to reduce the localized concentrations. During this evolutionary process the material contains a multi-domain structure with regions polarized in 180 degree(s) apart. Domain switching appears to be predominately 180 degree(s) without any 90 degree(s) domain reorientation occurring at the mesoscopic level. Results suggest that large stress/strain concentrations around voids could be a source for electric fatigue degradation.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sung S. Park, Gregory Paul Carman, and S. B. Park "Moire interferometer applied to a piezoceramic containing a simulated void", Proc. SPIE 3040, Smart Structures and Materials 1997: Smart Materials Technologies, (14 February 1997); doi: 10.1117/12.267105; https://doi.org/10.1117/12.267105
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