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8 December 1997 Characterization of the one-micron beam profile at the interface between the one-micron laser and the UV generation and transport subsystem
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Proceedings Volume 3047, Solid State Lasers for Application to Inertial Confinement Fusion: Second Annual International Conference; (1997) https://doi.org/10.1117/12.294259
Event: Second International Conference on Solid State Lasers for Application to ICF, 1996, Paris, France
Abstract
The near field irradiance parameters at the interface between the one micron laser, the UV generation, and transport subsystem will be discussed. The test results obtained from the Beamlet and Nova lasers used to validate the mathematical models will be presented.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
P. A. Renard, C. Clay Widmayer, Jerome M. Auerbach, Scott W. Haney, Mark A. Henesian, John T. Hunt, Janice K. Lawson, Kenneth R. Manes, David Milam, Charles D. Orth, Richard A. Sacks, David Ralph Speck, John B. Trenholme, and Wade H. Williams "Characterization of the one-micron beam profile at the interface between the one-micron laser and the UV generation and transport subsystem", Proc. SPIE 3047, Solid State Lasers for Application to Inertial Confinement Fusion: Second Annual International Conference, (8 December 1997); https://doi.org/10.1117/12.294259
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