One-micron focal spot and the power spectrum of the noise field at the entrance to the UV generation and transport subsystem

Janice K. Lawson; P. A. Renard; Mark A. Henesian; Richard A. Sacks; Jerome M. Auerbach; David Ralph Speck

doi:10.1117/12.294261

8 December 1997 One-micron focal spot and the power spectrum of the noise field at the entrance to the UV generation and transport subsystem

Janice K. Lawson, P. A. Renard, Mark A. Henesian, Richard A. Sacks, Jerome M. Auerbach, David Ralph Speck

Author Affiliations +

Proceedings Volume 3047, Solid State Lasers for Application to Inertial Confinement Fusion: Second Annual International Conference; (1997) https://doi.org/10.1117/12.294261
Event: Second International Conference on Solid State Lasers for Application to ICF, 1996, Paris, France

Abstract

We discuss the partitioning of effects on the fundamental focal irradiance distribution from whole beam self-focusing, and PSDs of the optical components in the laser chain. Beamlet and NIF simulation results are discussed.

Citation Download Citation

Janice K. Lawson, P. A. Renard, Mark A. Henesian, Richard A. Sacks, Jerome M. Auerbach, and David Ralph Speck "One-micron focal spot and the power spectrum of the noise field at the entrance to the UV generation and transport subsystem", Proc. SPIE 3047, Solid State Lasers for Application to Inertial Confinement Fusion: Second Annual International Conference, (8 December 1997); https://doi.org/10.1117/12.294261

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