28 February 1997 Multilevel optical memory with ellipsometry-based readout method
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Abstract
The aim of the present study is an investigation of ellipsometry based reading out method from multilevel optical recording medium. This method is based on the variation of ellipsometrical parameters of laser beam under reflection from the multilayered (or multilevel) recording medium. A mathematical simulation of the above mentioned recording medium was performed and the program for calculation of ellipsometrical parameters variation was developed under reflection from multilayered information carrier. The calculations for As2 Se3-As2S3 pairs of materials and a correspondent sample of four- layered information carrier were performed.
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Vasyliy G. Kravets, Vasyliy G. Kravets, Vladislav I. Zimenko, Vladislav I. Zimenko, V. I. Indutny, V. I. Indutny, Vasily V. Motuz, Vasily V. Motuz, N. E. Yanchyk, N. E. Yanchyk, } "Multilevel optical memory with ellipsometry-based readout method", Proc. SPIE 3055, International Conference on Optical Storage, Imaging, and Transmission of Information, (28 February 1997); doi: 10.1117/12.267705; https://doi.org/10.1117/12.267705
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