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13 August 1997 Technologies of high-performance thermography systems
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A family of 2 dimensional detection modules based on 256 by 256 and 486 by 640 platinum silicide (PtSi) focal planes, or 128 by 128 and 256 by 256 mercury cadmium telluride (MCT) focal planes for applications in either the 3 - 5 micrometer (MWIR) or 8 - 10 micrometer (LWIR) range was recently developed by AIM. A wide variety of applications is covered by the specific features unique for these two material systems. The PtSi units provide state of the art correctability with long term stable gain and offset coefficients. The MCT units provide extremely fast frame rates like 400 Hz with snapshot integration times as short as 250 microseconds and with a thermal resolution NETD less than 20 mK for e.g. the 128 by 128 LWIR module. The unique design idea general for all of these modules is the exclusively digital interface, using 14 bit analog to digital conversion to provide state of the art correctability, access to highly dynamic scenes without any loss of information and simplified exchangeability of the units. Device specific features like bias voltages etc. are identified during the final test and stored in a memory on the driving electronics. This concept allows an easy exchange of IDCAs of the same type without any need for tuning or e.g. the possibility to upgrade a PtSi based unit to an MCT module by just loading the suitable software. Miniaturized digital signal processor (DSP) based image correction units were developed for testing and operating the units with output data rates of up to 16 Mpixels/s. These boards provide the ability for freely programmable realtime functions like two point correction and various data manipulations in thermography applications.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rainer Breiter, Wolfgang A. Cabanski, Karl-Heinz Mauk, R. Koch, and Werner Rode "Technologies of high-performance thermography systems", Proc. SPIE 3061, Infrared Technology and Applications XXIII, (13 August 1997);

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