Bidirectional reflectance measurements for high-resolution signature modeling

David J. Thomas; James C. Jafolla; Peter J. Sarman

doi:10.1117/12.276667

20 June 1997 Bidirectional reflectance measurements for high-resolution signature modeling

David J. Thomas, James C. Jafolla, Peter J. Sarman

Proceedings Volume 3062, Targets and Backgrounds: Characterization and Representation III; (1997) https://doi.org/10.1117/12.276667
Event: AeroSense '97, 1997, Orlando, FL, United States

Abstract

Improvements in the fidelity of predictive computer models have brought requirements for more robust reflectance modeling. These requirements have focused new interest in measurement processes and data representation. Representation of the data is of critical importance to rendering models such as ray tracers and radiance renders. In these cases concise and accurate reflectance representation drives speed performance of the modeling. Many types of reflectance representations exist but the bidirectional reflectance is the most general case, from which all the others can be derived. This paper explores the bidirectional reflectance function, its measurement techniques and linkages into predictive modeling. Limitations to each of these areas will also be discussed.

Citation Download Citation

David J. Thomas, James C. Jafolla, and Peter J. Sarman "Bidirectional reflectance measurements for high-resolution signature modeling", Proc. SPIE 3062, Targets and Backgrounds: Characterization and Representation III, (20 June 1997); https://doi.org/10.1117/12.276667

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