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16 June 1997 Test results of a factory calibration technique for nonuniformity correction of an InSb infrared system
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Abstract
Residual fixed pattern noise (RFPN) is a strong system performance driver for missile seekers using infrared focal plane arrays (IRFPA). RFPN is a result of variations in response from detector to detector in an IRFPA given a uniform input flux. This issue is further complicated by the need for reasonable correction methods for a fielded system where blackbody sources would not be available. One means of correcting a fielded system is to determine and store gains at the factory, and collect a one point offset correction in the field. For this method to be viable, gains must be stable through time. This paper presents test results for a multi-point piecewise linear correction technique using stored gains with offsets being collected just prior to correction. Data on gain stability over time and FPA temperature are presented. Results are also presented for a linear correction technique used at various FPA temperatures between approximately 77.9 to 88.1 degrees Kelvin.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gill L. Duykers "Test results of a factory calibration technique for nonuniformity correction of an InSb infrared system", Proc. SPIE 3063, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing VIII, (16 June 1997); https://doi.org/10.1117/12.276069
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