15 July 1997 Optimum oversampling for laser-based and thermal-array scene projection methodologies
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Technology effects are underway at Arnold Engineering Development Center to extend closed-loop Direct Write Scene Generation capabilities to include advanced signal-injection and thermal-array optical projection capabilities. Laser- projection for sensor optics with or without optics installed, signal-injection, and thermal-array optical projection schemes provide direct simulation of dynamic electro-optic sensor systems. FPAs and electro-optic sensors are stimulated with simulated infrared scenes for optical diagnostics and evaluation of focal plane arrays or electro- optic sensor systems, and to simulate complex mission scenarios. Closed-loop operation can provide high-fidelity simulation of complex infrared scenes, sensor optical blurring, and other temporal effects such as jitter. Although all optical stimulation and testing methods have inherent advantages, compromises, and limitations, there is a common desire to not only maximize optical simulation and photonic stimulation fidelity through advanced verification and validation efforts, but to also minimize computational requirements for high-performance diagnostics. Computational and source-to-FPA oversampling have very similar fidelity defects and requirements for signal-injection, laser- projection, and thermal-array optical projection diagnostic- methods. This paper briefly describes scene generation and projection technology and corresponding research devoted to sampling issues and criteria related to FPA oversampling, corresponding fidelity defects, and performance trades.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sidney L. Steely, Sidney L. Steely, R. H. Fugerer, R. H. Fugerer, Heard S. Lowry, Heard S. Lowry, Ronald Dawbarn, Ronald Dawbarn, } "Optimum oversampling for laser-based and thermal-array scene projection methodologies", Proc. SPIE 3084, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II, (15 July 1997); doi: 10.1117/12.280951; https://doi.org/10.1117/12.280951

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