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Weakly twisted optically anisotropic media: is there an analogy between Hi-Bi fibers and liquid crystals?
Possibilities of ellipsometry with surface plasmon excitation in the investigation of thin films in comparison to separated ellipsometry and surface plasmon spectroscopy
Characterization of thin metal films with overlayers by transparency and multiangle including surface plasmon excitation reflectance ellipsometry method
Accuracy of traditional ellipsometry and complex ellipsometry-transmission photometry techniques for absorptive-film/transparent-substrate systems
Real-time monitoring and control during MBE growth of GaAs/AlGaAs Bragg reflectors using multiwave ellipsometry
Ellipsometric studies of the effect of a metal island structure on the optic properties of a semiconductor surface
Determination of anisotropic film thickness, complex reflective indices, and their dispersion from reflectance spectra
Thin-film analysis based on the ratio of envelopes of the reflectance spectra measured at two incident angles
Effect of matching layer on polarization photosensitivity of an AIIIBV Schottky-barrier photodetector monolithically integrated with an optical waveguide