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1 April 1997 Ellipsometric studies of photochromic ultrathin polymer films
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Proceedings Volume 3094, Polarimetry and Ellipsometry; (1997)
Event: Polarimetry and Ellipsometry, 1996, Kazimierz Dolny, Poland
We present ellipsometric measurements on Langmuir-Blodgett monolayer assemblies of photochromic polymers; the polymer we used was a statistical copolymer with polymethacrylate mainchains and azobenzene sidegroups. Ellipsometry gives a value of n equals 1.557 for the refractive index and a film thickness of 1.58 nm per monolayer. When exposed to light of appropriate wavelength, the azobenzene groups undergo a trans (reversible reaction) cis photoisomerization process which was monitored by ellipsometry. We found an average change in film thickness of 0.02 nm per monolayer during the trans(reversible reaction)cis transition process, whereas the data obtained do not show any significant change in refractive index.
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Harald Knobloch, S. Katholy, Horst Orendi, J. Hesse, Dietrich Prescher, Ludwig Brehmer, and Ralf Ruhmann "Ellipsometric studies of photochromic ultrathin polymer films", Proc. SPIE 3094, Polarimetry and Ellipsometry, (1 April 1997);

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