Paper
18 August 1997 Investigations on beam profiles and beam propagation of astigmatic laser diodes with an optical near-field microscope
Chunqing Gao, Ari T. Friberg, R. Motzkus, Norbert Reng
Author Affiliations +
Proceedings Volume 3097, Lasers in Material Processing; (1997) https://doi.org/10.1117/12.281123
Event: Lasers and Optics in Manufacturing III, 1997, Munich, Germany
Abstract
For industrial applications of high power laser diodes it is of interest to know the focal region of the laser beam for efficient fiber coupling and material processing. Similar questions also occur with laser diodes for the optical communication industry. For efficient fiber coupling the beam shall be round and its waist situated at the fiber entrance. With an optical near field microscope we investigated the near field at the facettes of the laser diode and documented the change when leaving the laser diode in micrometer steps. It is a non paraxial laser beam. The beam radii can be evaluated from the intensity profiles and so the caustic curve of the laser beam in x- and y- direction, which in the ideal case yields a hyperbolic propagation law.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chunqing Gao, Ari T. Friberg, R. Motzkus, and Norbert Reng "Investigations on beam profiles and beam propagation of astigmatic laser diodes with an optical near-field microscope", Proc. SPIE 3097, Lasers in Material Processing, (18 August 1997); https://doi.org/10.1117/12.281123
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KEYWORDS
Semiconductor lasers

Near field scanning optical microscopy

Near field

Laser beam propagation

Near field optics

Microscopes

Collimation

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