17 September 1997 Source considerations for low-coherence speckle interferometry
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Proceedings Volume 3098, Optical Inspection and Micromeasurements II; (1997) https://doi.org/10.1117/12.281175
Event: Lasers and Optics in Manufacturing III, 1997, Munich, Germany
A range of sources are investigated to determine their suitability for low coherence speckle interferometry. Sources include a superluminescent diode (SLD), a multimode laser diode (MMLD) and two MMLDs. The coherence lengths for each are determined using a Michelson interferometer and are then compared with those obtained from a speckle interferometer. Two MMLDs at 792nm and 812nm are found to provide a coherence length of 10.2 micrometers comparable with that of the SLD. The dual MMLD source arrangement provides ten to a hundred times greater optical power on the test object making the technique viable for large area test objects.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Itziar Balboa, Ralph P. Tatam, "Source considerations for low-coherence speckle interferometry", Proc. SPIE 3098, Optical Inspection and Micromeasurements II, (17 September 1997); doi: 10.1117/12.281175; https://doi.org/10.1117/12.281175

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