25 September 1997 3D-metrologies for industrial applications
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Proceedings Volume 3102, Rapid Prototyping and Flexible Manufacturing; (1997) https://doi.org/10.1117/12.281314
Event: Lasers and Optics in Manufacturing III, 1997, Munich, Germany
Abstract
Three-dimensional-metrology based on photogrammetric and topometric techniques is a powerful tool for the digitization and measurement of complex three-dimensional scenes and objects. Since several years advanced sensors and measurement systems are available for industrial applications. Especially the integration of topometric systems into measuring- and handling machines is supported by compact and light 3D- sensors. These sensors can be optimized for specific measuring tasks with respect to accuracy, field of view and further parameters. During the last two years one is going to describe both techniques by the same algorithms. Moreover, there are first approaches of 'topogrammetric' systems, that combine photogrammetric and topometric metrologies, especially by using calibration techniques that are well known in photogrammetry and which allow the on-line calibration of 3D- sensors. On the other hand the topometric projection of coded light provides a continuous indexing of the whole measuring scene where photogrammetric methods (without active illumination) are limited to a lower number of discrete index marks.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bernd Breuckmann, Frank Halbauer, Erik Klaas, Michael Kube, "3D-metrologies for industrial applications", Proc. SPIE 3102, Rapid Prototyping and Flexible Manufacturing, (25 September 1997); doi: 10.1117/12.281314; https://doi.org/10.1117/12.281314
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