22 September 1997 Photoacoustic spectroscopy of photovoltaic materials
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Proceedings Volume 3110, 10th Meeting on Optical Engineering in Israel; (1997) https://doi.org/10.1117/12.281326
Event: 10th Meeting on Optical Engineering in Israel, 1997, Jerusalem, Israel
Abstract
A photoacoustic spectrometer is described which has been constructed to measure the spectra of photovoltaic materials in the ultra violet, visible and near infra red regions. The range of this photoacoustic spectrometer is from 0.3 to 1.8 micrometers. This technique has the advantage of being non- intrusive and non-destructive. Measurements have been made of a variety of photovoltaic materials, including a CdS/CuIn1- xGaxSe2 heterojunction and an InP/InGaAsP quantum well layer system. Bands arising from intrinsic impurity subgap levels were observed beyond the band edges.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. A. Slifkin, M. A. Slifkin, L. Lurie, L. Lurie, Aryeh M. Weiss, Aryeh M. Weiss, } "Photoacoustic spectroscopy of photovoltaic materials", Proc. SPIE 3110, 10th Meeting on Optical Engineering in Israel, (22 September 1997); doi: 10.1117/12.281326; https://doi.org/10.1117/12.281326
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