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22 September 1997 Third harmonic generation for nonlinear scanning laser microscopy
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Proceedings Volume 3110, 10th Meeting on Optical Engineering in Israel; (1997) https://doi.org/10.1117/12.281367
Event: 10th Meeting on Optical Engineering in Israel, 1997, Jerusalem, Israel
Abstract
Third harmonic generation near the focal point of a tightly focused beam is used to probe microscopical structures of transparent samples. The axial resolution at which this method can resolve interfaces and inhomogeneities is shown to be comparable with the confocal length of the beam. Using 125 femtosecond pulses at 1.5 micrometers , we were able to resolve interfaces with a resolution of 1.2 micrometers and to produce 2D cross-sectional images of the samples used.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Y. Barad, M. Horowitz, and Yaron Silberberg "Third harmonic generation for nonlinear scanning laser microscopy", Proc. SPIE 3110, 10th Meeting on Optical Engineering in Israel, (22 September 1997); https://doi.org/10.1117/12.281367
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