22 September 1997 Wavelet image processing for optical pattern recognition and feature extraction
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Proceedings Volume 3110, 10th Meeting on Optical Engineering in Israel; (1997) https://doi.org/10.1117/12.281396
Event: 10th Meeting on Optical Engineering in Israel, 1997, Jerusalem, Israel
Abstract
This paper discusses a new method for performing wavelet-based pattern recognition and feature extraction. Known as 'progressive pattern recognition,' this approach is based on performing a subband transform of a target image and then performing partial correlations with different subband resolutions; it is possible to recognize the image without correlating against the complete wavelet transform, thereby realizing considerable savings in computational time. Computer simulations of palm print recognition are presented, and extensions to both scale and rotation invariant systems and optical implementations are discussed.
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Casimer M. DeCusatis, Casimer M. DeCusatis, A. Abbatte, A. Abbatte, Daniel M. Litynski, Daniel M. Litynski, Pankaj K. Das, Pankaj K. Das, } "Wavelet image processing for optical pattern recognition and feature extraction", Proc. SPIE 3110, 10th Meeting on Optical Engineering in Israel, (22 September 1997); doi: 10.1117/12.281396; https://doi.org/10.1117/12.281396
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