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11 July 1997 Mirror surface characterization by topography with coherent x rays
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Abstract
It is shown that the x-ray mirrors which have been made on the verge of potentialities of the modern technology, give rise to deterioration of the coherent properties of the beam delivered by the third generation synchrotron radiation sources. In other words mirrors produce speckle structure in the reflected x-ray beam. The theoretical analysis of partially coherent x- ray beam scattered by moderately rough mirror surface under the total reflection condition is presented and the estimates for the intensity contrast as a function of the surface parameters are given. The observed speckle structure was experimentally recorded by means of high resolution photo film. It is shown that the polishing process must be significantly improved in the case of the long mirrors (approximately 1 m) used as the standard optical elements at the beamlines, while small mirrors (less than 0.2 m) are in a better state and may be applied to various imaging techniques exploiting coherent x-ray properties.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexei Souvorov, Irina Snigireva, and Anatoly A. Snigirev "Mirror surface characterization by topography with coherent x rays", Proc. SPIE 3113, Grazing Incidence and Multilayer X-Ray Optical Systems, (11 July 1997); https://doi.org/10.1117/12.278879
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