Spectral fitting in AXAF calibration detectors

Richard J. Edgar; Eugene Y. Tsiang; Allyn F. Tennant; S. A. Vitek; Douglas A. Swartz

doi:10.1117/12.278841

11 July 1997 Spectral fitting in AXAF calibration detectors

Richard J. Edgar, Eugene Y. Tsiang, Allyn F. Tennant, S. A. Vitek, Douglas A. Swartz

Proceedings Volume 3113, Grazing Incidence and Multilayer X-Ray Optical Systems; (1997) https://doi.org/10.1117/12.278841
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

We discuss details of the spectral fitting procedures and algorithms used in deriving line count rates for the calibration of AXAF (the Advanced X-ray Astrophysics Facility) during end-to-end testing in the winter and spring of 1996/1997. An approach involving simultaneously fitting both detector and source parameters was implemented within XSPEC, a standard x-ray spectral fitting package (Arnaud 1996). Theoretical and practical difficulties in fitting spectra taken with flow proportional counters (FPC) and solid state detectors (SSD) are discussed, including both effects incorporated into the numerical model, and those which must be estimated outside the model. Sensitivity of the parameter of interest, the counts in a strong line in the spectrum, to changes and errors in the other fit parameters is explored. The impact of uncertainties on the overall absolute AXAF calibration is discussed.

Citation Download Citation

Richard J. Edgar, Eugene Y. Tsiang, Allyn F. Tennant, S. A. Vitek, and Douglas A. Swartz "Spectral fitting in AXAF calibration detectors", Proc. SPIE 3113, Grazing Incidence and Multilayer X-Ray Optical Systems, (11 July 1997); https://doi.org/10.1117/12.278841

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