15 October 1997 Hard x-ray calibration facility design for JEM-X detector on board INTEGRAL
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Abstract
The x-ray monitor JEM-X will be flown aboard the ESA mission INTEGRAL for gamma-ray astronomy. It has been conceived to furnish images of celestial sources in fields of the sky 9.1 deg wide in the 3 - 100 keV extended energy band. Careful on- ground calibrations are needed to verify the spectral capabilities of the JEM-X detector. These operations in the 20 - 100 keV energy band are planned to be performed using a hard x-ray (15 - 140 keV) facility operated at University of Ferrara (Italy). We present the apparatus that will be used to carry out these calibrations. In particular we describe a double-reflection fixed-exit system of monochromatization based on silicon crystals that are implemented in the facility.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Giovanni Pareschi, Filippo Frontera, Carlo Pelliciari, Guido Zavattini, Vittore Carassiti, Federico Evangelisti, "Hard x-ray calibration facility design for JEM-X detector on board INTEGRAL", Proc. SPIE 3114, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII, (15 October 1997); doi: 10.1117/12.283783; https://doi.org/10.1117/12.283783
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