15 October 1997 Hard x-ray calibration facility design for JEM-X detector on board INTEGRAL
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The x-ray monitor JEM-X will be flown aboard the ESA mission INTEGRAL for gamma-ray astronomy. It has been conceived to furnish images of celestial sources in fields of the sky 9.1 deg wide in the 3 - 100 keV extended energy band. Careful on- ground calibrations are needed to verify the spectral capabilities of the JEM-X detector. These operations in the 20 - 100 keV energy band are planned to be performed using a hard x-ray (15 - 140 keV) facility operated at University of Ferrara (Italy). We present the apparatus that will be used to carry out these calibrations. In particular we describe a double-reflection fixed-exit system of monochromatization based on silicon crystals that are implemented in the facility.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Giovanni Pareschi, Giovanni Pareschi, Filippo Frontera, Filippo Frontera, Carlo Pelliciari, Carlo Pelliciari, Guido Zavattini, Guido Zavattini, Vittore Carassiti, Vittore Carassiti, Federico Evangelisti, Federico Evangelisti, } "Hard x-ray calibration facility design for JEM-X detector on board INTEGRAL", Proc. SPIE 3114, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII, (15 October 1997); doi: 10.1117/12.283783; https://doi.org/10.1117/12.283783


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