7 July 1997 Material parameter and performance variation in 4 x 4 pixelated CdZnTe detectors
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Cadmium zinc telluride (CZT) gamma-ray detectors show great potential in medical and nuclear material imaging applications. These imagers rely on pixellated arrays of CZT for their operation. Systematic and random material variation among the pixels can introduce noise into the system and makes data analysis more complicated. Photo induced transient current spectroscopy (PICTS), and low temperature photoluminescence have been employed to analyze 4 by 4 pixellated arrays and to determine material variation among the pixels. Particular pixels that have proven to perform well or poorly have been studied in detail to try and identify the origin of this performance variation. This paper reports preliminary results and comments on future analysis.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bruce Andrew Brunett, James E. Toney, Tuviah E. Schlesinger, Ralph B. James, Michael C. Driver, Elgin E. Eissler, "Material parameter and performance variation in 4 x 4 pixelated CdZnTe detectors", Proc. SPIE 3115, Hard X-Ray and Gamma-Ray Detector Physics, Optics, and Applications, (7 July 1997); doi: 10.1117/12.277704; https://doi.org/10.1117/12.277704

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