7 July 1997 Orthogonal strip gamma-ray imaging system for use with HgI2 and Cd1-xZnxTe detectors
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We have designed and constructed an orthogonal strip imaging system for use with room temperature semiconductor strip detectors. The system has been tested with both HgI2 and Cd1-xZnxTe (CZT) detector elements. Our first system consists of complete readout electronics and software for spectroscopy and imaging with 8 by 8 orthogonal strip detectors. The readout electronics consist of 16 channels of hybrid charge sensitive preamplifiers, and 16 channels of parallel discriminators, shaping amplifiers, and a 16 channel ADC implemented in CAMAC and NIM. The software used to readout the instrument is capable of performing intensity measurements as well as spectroscopy on all 64 pixels of the device. In this paper we describe measurements to determine the factors limiting the performance of this system.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nathan R. Hilton, Nathan R. Hilton, James C. Lund, James C. Lund, Jack E. McKisson, Jack E. McKisson, Bruce Andrew Brunett, Bruce Andrew Brunett, John M. Van Scyoc, John M. Van Scyoc, Ralph B. James, Ralph B. James, H. Bradford Barber, H. Bradford Barber, } "Orthogonal strip gamma-ray imaging system for use with HgI2 and Cd1-xZnxTe detectors", Proc. SPIE 3115, Hard X-Ray and Gamma-Ray Detector Physics, Optics, and Applications, (7 July 1997); doi: 10.1117/12.277686; https://doi.org/10.1117/12.277686


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