PROCEEDINGS VOLUME 3121
OPTICAL SCIENCE, ENGINEERING AND INSTRUMENTATION '97 | 27 JULY - 1 AUGUST 1997
Polarization: Measurement, Analysis, and Remote Sensing
OPTICAL SCIENCE, ENGINEERING AND INSTRUMENTATION '97
27 July - 1 August 1997
San Diego, CA, United States
Polarization Measurements and Instruments I
Proc. SPIE 3121, Object detection in turbid media by differential backscattering of polarized light, 0000 (3 October 1997); doi: 10.1117/12.278959
Proc. SPIE 3121, Phase shifting interferometric imaging ellipsometer, 0000 (3 October 1997); doi: 10.1117/12.283853
Proc. SPIE 3121, Measurement of waveplate retardation using a photoelastic modulator, 0000 (3 October 1997); doi: 10.1117/12.278971
Proc. SPIE 3121, Measurement of low-level strain retardation in optical materials, 0000 (3 October 1997); doi: 10.1117/12.278974
Proc. SPIE 3121, Alignment and calibration of an infrared achromatic retarder using FTIR Mueller matrix spectropolarimetry, 0000 (3 October 1997); doi: 10.1117/12.283867
Proc. SPIE 3121, Performance of a four-channel polarimeter with low-light-level detection, 0000 (3 October 1997); doi: 10.1117/12.283869
Proc. SPIE 3121, Mueller matrix imaging of GaAs/AlGaAs self-imaging beamsplitting waveguides, 0000 (3 October 1997); doi: 10.1117/12.278982
Proc. SPIE 3121, Polarization-sensitive infrared sensor for target discrimination, 0000 (3 October 1997); doi: 10.1117/12.278986
Proc. SPIE 3121, Polarization signatures of spherical and conical targets measured by Mueller matrix imaging polarimetry, 0000 (3 October 1997); doi: 10.1117/12.278987
Proc. SPIE 3121, Polarization analysis system for very rough surfaces, 0000 (3 October 1997); doi: 10.1117/12.278960
Polarization Theory, Mathematics, and Modeling
Proc. SPIE 3121, Physical interpretation of eigenvalue problems in optical scattering polarimetry, 0000 (3 October 1997); doi: 10.1117/12.278961
Proc. SPIE 3121, Polarized laser retroreflectance, 0000 (3 October 1997); doi: 10.1117/12.278962
Proc. SPIE 3121, Error propagation in decomposition of Mueller matrices, 0000 (3 October 1997); doi: 10.1117/12.278963
Proc. SPIE 3121, Scattering from coated random rough surfaces characterized by the Mueller matrix, 0000 (3 October 1997); doi: 10.1117/12.278964
Proc. SPIE 3121, Co- and cross-polarized fields scattered from irregular layered structures: full wave analysis, 0000 (3 October 1997); doi: 10.1117/12.278965
Proc. SPIE 3121, Polarization rendering for modeling of coherent polarized speckle backscatter using TASAT, 0000 (3 October 1997); doi: 10.1117/12.283854
Polarization Measurements and Instruments II
Proc. SPIE 3121, Visible Mueller matrix spectropolarimetry, 0000 (3 October 1997); doi: 10.1117/12.283855
Proc. SPIE 3121, Electro-optic spatial light modulator characterization using Mueller matrix imaging, 0000 (3 October 1997); doi: 10.1117/12.278966
Proc. SPIE 3121, Polarizational two-beam interferometer for nonlinear optical characterization, 0000 (3 October 1997); doi: 10.1117/12.278967
Proc. SPIE 3121, Bidirectional ellipsometry and its application to the characterization of surfaces, 0000 (3 October 1997); doi: 10.1117/12.278968
Devices and Standards
Proc. SPIE 3121, Standards for linear retardance, 0000 (3 October 1997); doi: 10.1117/12.278970
Proc. SPIE 3121, Near-achromatic retardance behavior of HN22 Polaroid 3.6 to 5.4 um, 0000 (3 October 1997); doi: 10.1117/12.283856
Proc. SPIE 3121, Evaluation of a selection of commercial polarizers and retarders at visible and near-infrared wavelengths, 0000 (3 October 1997); doi: 10.1117/12.283857
Proc. SPIE 3121, Characterization of infrared polarizers, 0000 (3 October 1997); doi: 10.1117/12.283858
Proc. SPIE 3121, Polarization properties of coated and uncoated parallel-slab multireflection beam splitters, 0000 (3 October 1997); doi: 10.1117/12.283859
Proc. SPIE 3121, Analysis of poling-induced birefringence on the design of polarization-independent nonlinear optical polymeric devices, 0000 (3 October 1997); doi: 10.1117/12.278972
Proc. SPIE 3121, Fiber optic polarimetric temperature sensor with high sensitivity, 0000 (3 October 1997); doi: 10.1117/12.283860
Proc. SPIE 3121, Depolarization of infrared radiation reflected from rough surfaces, 0000 (3 October 1997); doi: 10.1117/12.278973
Remote Sensing
Proc. SPIE 3121, Vegetative target enhancement in natural scenes using multiband polarization methods, 0000 (3 October 1997); doi: 10.1117/12.283861
Proc. SPIE 3121, MODIS polarization measurements and simulation and the 4O effect, 0000 (3 October 1997); doi: 10.1117/12.283862
Proc. SPIE 3121, Contrast enhancement in natural scenes using multiband polarization methods, 0000 (3 October 1997); doi: 10.1117/12.283863
Proc. SPIE 3121, Investigation of atmospheric aerosol properties using ground-based spectropolarimeter, 0000 (3 October 1997); doi: 10.1117/12.290136
Proc. SPIE 3121, Enhancement of vegetation mapping using Stokes parameter images, 0000 (3 October 1997); doi: 10.1117/12.283864
Proc. SPIE 3121, Stokes parameter imaging of scattering surfaces, 0000 (3 October 1997); doi: 10.1117/12.278976
Proc. SPIE 3121, Influence of aerosol on the degree of linear polarization of skylight in the O2-A band, 0000 (3 October 1997); doi: 10.1117/12.278977
Proc. SPIE 3121, Use of polarization for cloud study, 0000 (3 October 1997); doi: 10.1117/12.283865
Proc. SPIE 3121, Aerosol retrieval using the POLDER instrument: preliminary results, 0000 (3 October 1997); doi: 10.1117/12.283866
Proc. SPIE 3121, Application of an AOTF imaging spectropolarimeter, 0000 (3 October 1997); doi: 10.1117/12.278978
Poster Session
Proc. SPIE 3121, High-spectral resolution polarization measurements of the atmosphere with the GOME BBM, 0000 (3 October 1997); doi: 10.1117/12.283868
Polarization Measurements and Instruments III
Proc. SPIE 3121, Mueller-matrix ellipsometry: a review, 0000 (3 October 1997); doi: 10.1117/12.283870
Proc. SPIE 3121, Four-port Fabry-Perot/Michelson interferometer: polarization-dependent response and ellipsometry, 0000 (3 October 1997); doi: 10.1117/12.278980
Polarization Measurements and Instruments II
Proc. SPIE 3121, Geometrical phase measurement with a Michelson interferometer for microsurface characterization, 0000 (3 October 1997); doi: 10.1117/12.283871
Remote Sensing
Proc. SPIE 3121, Polarimetric properties of atmospheric aerosols, 0000 (3 October 1997); doi: 10.1117/12.278981
Proc. SPIE 3121, Remote sensing of high-latitude wetlands using polarized wide-angle imagery, 0000 (3 October 1997); doi: 10.1117/12.283872
Poster Session
Proc. SPIE 3121, Industrial applications on reflective or translucent samples of a novel automated Meuller-matrix scatterometer, 0000 (3 October 1997); doi: 10.1117/12.278983
Proc. SPIE 3121, Multiple scattering in chiral media: border effects, reduced depolarization, and sensitivity limit, 0000 (3 October 1997); doi: 10.1117/12.283873
Remote Sensing
Proc. SPIE 3121, Analysis of ground-based polarimetric sky radiance measurements, 0000 (3 October 1997); doi: 10.1117/12.278984
Polarization Measurements and Instruments III
Proc. SPIE 3121, Polarizing properties of silver/glass nanocomposites, 0000 (3 October 1997); doi: 10.1117/12.278985
Proc. SPIE 3121, Backscattering Mueller matrices from bead-blasted aluminium surfaces, 0000 (3 October 1997); doi: 10.1117/12.283874
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