Translator Disclaimer
Paper
3 October 1997 Alignment and calibration of an infrared achromatic retarder using FTIR Mueller matrix spectropolarimetry
Author Affiliations +
Abstract
An IR achromatic retarder was aligned and characterized using the University of Alabama in Huntsville's Fourier transform IR spectropolarimeter. The FTIR spectropolarimeter produces a full polarization description of a sample over wavelengths 3-14 micrometers . Mueller matrices were measured for different relative alignments between the complementary plates of the achromat until the retardance orientation variation was reduced to within +/- 1 degree and the retardance magnitude varied smoothly with a peak-to-valley difference of 24 degrees from 4-14 micrometers . The results presented here include the progression of retardance magnitudes and retardance orientations as the plates alignment varied as well as the final Mueller matrix and retardance components of the achromat element.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Elizabeth A. Sornsin and Russell A. Chipman "Alignment and calibration of an infrared achromatic retarder using FTIR Mueller matrix spectropolarimetry", Proc. SPIE 3121, Polarization: Measurement, Analysis, and Remote Sensing, (3 October 1997); https://doi.org/10.1117/12.283867
PROCEEDINGS
7 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT

Infrared Spectropolarimetry
Proceedings of SPIE (January 25 1990)
Mueller matrix algorithms
Proceedings of SPIE (December 11 1992)
Broadband (UV-VIS-NIR) Mueller matrix polarimeter
Proceedings of SPIE (September 09 2011)
Precision polarimetry of optical components (Invited Paper)
Proceedings of SPIE (October 20 1992)

Back to Top