3 October 1997 Backscattering Mueller matrices from bead-blasted aluminium surfaces
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Abstract
The backscattering Mueller matrices for a range of bead- blasted aluminium samples having a range of surface roughness and slopes are investigated using a 632.8nm linearly polarized HeNe laser. The analyzing polarizing optics and detector are fixed in the backscattering direction and the angle of incidence varied from 0 degrees to 90 degrees. A computer controlled Mueller matrix scatterometer determines the matrix elements. The incident polarization states are set via combinations of a polarizer and waveplates and the backscattered light is Fourier analyzed using a rotating compensator and fixed linear polarizer. The surfaces were characterized using a surface profilometer and the variation of the Mueller matrix elements with incidence angle determined. Only four elements of the normalized Mueller matrix are non-zero. Of these, three vary with incidence angle and the fourth is normalized to unity. A depolarization term PD calculated from the matrix elements is shown to decrease with increasing angle of incidence. Its value at normal incidence reduces with increasing bead-blast pressure.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gareth D. Lewis, David L. Jordan, "Backscattering Mueller matrices from bead-blasted aluminium surfaces", Proc. SPIE 3121, Polarization: Measurement, Analysis, and Remote Sensing, (3 October 1997); doi: 10.1117/12.283874; https://doi.org/10.1117/12.283874
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