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3 October 1997 Electro-optic spatial light modulator characterization using Mueller matrix imaging
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A series of electro-optic spatial light modulators have been measured with the Mueller matrix imaging polarimeter (MMIP). The MMIP is a dual rotating-retarder polarimeter which illuminates a sample with calibrated polarized states and analytes the existing polarized state over a spatially resolved image of the sample. Images of the retardance magnitude and retardance fast axis orientation reveal the relative electric field strengths in a device with lead- lanthanum-zirconate-titanate modulating material. By measuring Mueller matrix images of the device at several different applied voltages, a quadratic electro-optic coefficient of 2 X 10-16 (m/V)2 was determined in the modulator active regions.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Elizabeth A. Sornsin and Russell A. Chipman "Electro-optic spatial light modulator characterization using Mueller matrix imaging", Proc. SPIE 3121, Polarization: Measurement, Analysis, and Remote Sensing, (3 October 1997);

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