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3 October 1997 Measurement of low-level strain retardation in optical materials
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Abstract
A method for measurement of low-level strain birefringence in optical elements and materials will be described. This method provides for the simultaneous measurement of magnitude and direction of the net retardation without the necessity of sample rotation. Good agreement was obtained between measured retardation and independent measurements of a polymer waveplate. Measurements were also made of uncalibrated samples with retardation magnitudes down to 1.5 nanometers.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Theodore C. Oakberg "Measurement of low-level strain retardation in optical materials", Proc. SPIE 3121, Polarization: Measurement, Analysis, and Remote Sensing, (3 October 1997); https://doi.org/10.1117/12.278974
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