3 October 1997 Scattering from coated random rough surfaces characterized by the Mueller matrix
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Abstract
The Mueller matrix completely characterizes scattered electromagnetic waves. It relates the incident to the scattered Stokes vectors. The Mueller matrix which contains intensity and relative phase data is very useful for remote sensing. The Mueller matrix , characterizing scattering from uniformly coated 2D random rough surfaces are assumed to be homogeneous, and isotropic with a Gaussian surface height joint probability density function. The diffuse, incoherent and coherent contributions to the Mueller matrix elements are evaluated. The Mueller matrix elements are more sensitive to the changes in the rms slope than to changes in the rms height. The element M34 equals M43 is most sensitive to variations in the thickness of the coating layer. This result could be used to estimate the thickness of the coating material. The magnitudes of the Mueller matrix elements are considerably more sensitive to changes in dissipation in the coating material than to changes in dissipation of the substrate.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yuzhi Zhang, Yuzhi Zhang, Ezekiel Bahar, Ezekiel Bahar, } "Scattering from coated random rough surfaces characterized by the Mueller matrix", Proc. SPIE 3121, Polarization: Measurement, Analysis, and Remote Sensing, (3 October 1997); doi: 10.1117/12.278964; https://doi.org/10.1117/12.278964
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