3 October 1997 Visible Mueller matrix spectropolarimetry
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A Mueller matrix spectropolarimeter operating between 400- 900nm has been developed for optical element characterization at The University of Alabama in Huntsville. Mueller matrices are measured as a function of wavelength and the spectral behavior of the polarization properties can be determined. Measurements of an achromatic retarder in transmission, a reflective beamsplitter, and the electro- optic dispersion of a spatial light modulator will be presented.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Elizabeth A. Sornsin, Russell A. Chipman, "Visible Mueller matrix spectropolarimetry", Proc. SPIE 3121, Polarization: Measurement, Analysis, and Remote Sensing, (3 October 1997); doi: 10.1117/12.283855; https://doi.org/10.1117/12.283855

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