PROCEEDINGS VOLUME 3134
OPTICAL SCIENCE, ENGINEERING AND INSTRUMENTATION '97 | 27 JULY - 1 AUGUST 1997
Optical Manufacturing and Testing II
Editor(s): H. Philip Stahl
IN THIS VOLUME

12 Sessions, 60 Papers, 0 Presentations
LIGO  (4)
Sapphire  (5)
OPTICAL SCIENCE, ENGINEERING AND INSTRUMENTATION '97
27 July - 1 August 1997
San Diego, CA, United States
Programs/Projects
Proc. SPIE 3134, Optical manufacturing requirements for an AVLIS plant, 0000 (1 November 1997); doi: 10.1117/12.295120
Proc. SPIE 3134, Specification of optical components for a high-average-power laser environment, 0000 (1 November 1997); doi: 10.1117/12.279121
Proc. SPIE 3134, Testing of optical components to assure performance in a high-average-power environment, 0000 (1 November 1997); doi: 10.1117/12.279124
Proc. SPIE 3134, Fabrication and testing of sample cells for the Space Shuttle PHASE Experiment, 0000 (1 November 1997); doi: 10.1117/12.295140
Proc. SPIE 3134, Fabrication of large secondary mirrors for astronomical telescopes, 0000 (1 November 1997); doi: 10.1117/12.295151
Proc. SPIE 3134, Fabrication and testing of the ITTT beryllium secondary mirror, 0000 (1 November 1997); doi: 10.1117/12.295156
LIGO
Proc. SPIE 3134, LIGO Pathfinder optics: fabrication techniques and procedures, 0000 (1 November 1997); doi: 10.1117/12.279139
Proc. SPIE 3134, Metrology of LIGO Pathfinder optics, 0000 (1 November 1997); doi: 10.1117/12.279140
Proc. SPIE 3134, Results of the calibration of interferometer transmission flats for the LIGO Pathfinder optics, 0000 (1 November 1997); doi: 10.1117/12.295121
Proc. SPIE 3134, Measurements of the LIGO Pathfinder optics, 0000 (1 November 1997); doi: 10.1117/12.295122
Transfer Functions
Proc. SPIE 3134, Transfer function characterization of laser Fizeau interferometer for high-spatial-frequency phase measurements, 0000 (1 November 1997); doi: 10.1117/12.295123
Proc. SPIE 3134, Automated MTF analyzer for spectacle lenses, 0000 (1 November 1997); doi: 10.1117/12.295124
Poster Session
Proc. SPIE 3134, MTF measurement of LCDs by a linear CCD imager: I. Monochrome case, 0000 (1 November 1997); doi: 10.1117/12.295125
System Testing
Proc. SPIE 3134, Optical system test methods with photothermoplastic carrier, 0000 (1 November 1997); doi: 10.1117/12.295126
Proc. SPIE 3134, Smart collimation system using binary spiral gratings, 0000 (1 November 1997); doi: 10.1117/12.279118
Optical Manufacturing
Proc. SPIE 3134, Glass-ceramics: deterministic microgrinding, lapping, and polishing, 0000 (1 November 1997); doi: 10.1117/12.279119
Proc. SPIE 3134, Comparison of materials for use in the precision grinding of optical components, 0000 (1 November 1997); doi: 10.1117/12.295127
Proc. SPIE 3134, Application of coolants in deterministic microgrinding of glass, 0000 (1 November 1997); doi: 10.1117/12.279120
Proc. SPIE 3134, Strategies for truing/dressing technique and precision grinding performance of superabrasive wheel for brittle-material components, 0000 (1 November 1997); doi: 10.1117/12.279122
Proc. SPIE 3134, Dynamic model for bound abrasive grinding and its application, 0000 (1 November 1997); doi: 10.1117/12.295128
Proc. SPIE 3134, Relationship between microgrinding parameters and lens surface features, 0000 (1 November 1997); doi: 10.1117/12.279123
Proc. SPIE 3134, Rapid convergence on high-frequency errors in computer-controlled optical fabrication, 0000 (1 November 1997); doi: 10.1117/12.295129
Proc. SPIE 3134, Applications of the rapidly renewable lap, 0000 (1 November 1997); doi: 10.1117/12.295130
Proc. SPIE 3134, Pad polishing for rapid production of large flats, 0000 (1 November 1997); doi: 10.1117/12.295131
Proc. SPIE 3134, Magnetorheological finishing of IR materials, 0000 (1 November 1997); doi: 10.1117/12.295132
Sapphire
Proc. SPIE 3134, Using advanced diagnostics to detect subsurface damage in sapphire, 0000 (1 November 1997); doi: 10.1117/12.295133
Proc. SPIE 3134, Controlling stress in sapphire optics, 0000 (1 November 1997); doi: 10.1117/12.295134
Proc. SPIE 3134, Workpiece roughness and grindability, 0000 (1 November 1997); doi: 10.1117/12.279125
Proc. SPIE 3134, Computer-controlled fabrication of sapphire windows, 0000 (1 November 1997); doi: 10.1117/12.295135
Proc. SPIE 3134, Spinel: where did it go?, 0000 (1 November 1997); doi: 10.1117/12.279126
Precision Machining
Proc. SPIE 3134, Performance evaluation and optimization of a fast tool servo for single point diamond turning machines, 0000 (1 November 1997); doi: 10.1117/12.295136
Proc. SPIE 3134, Fabrication technique for the production of on- and off-axis conic surfaces of revolution (WAGNER), 0000 (1 November 1997); doi: 10.1117/12.279127
Proc. SPIE 3134, Rapid fabrication and characterization of sine wave targets, 0000 (1 November 1997); doi: 10.1117/12.279128
Diffractive Optical Elements
Proc. SPIE 3134, Low-cost high-volume lens using diffractive technology, 0000 (1 November 1997); doi: 10.1117/12.279129
Proc. SPIE 3134, Forming of selected unimodal complex amplitude distributions by means of novel DOEs of MODAN type, 0000 (1 November 1997); doi: 10.1117/12.295137
Poster Session
Proc. SPIE 3134, Ray-tracing-based phase elements as tools for CO2 laser beam profile homogenization: influence of different parameters and ranges of tolerances, 0000 (1 November 1997); doi: 10.1117/12.295138
Optical Testing
Proc. SPIE 3134, Absolute interferometric calibration of toric and conical surfaces, 0000 (1 November 1997); doi: 10.1117/12.295139
Proc. SPIE 3134, Demonstration of accuracy and flexibility of using CGH test plates for measuring aspheric surfaces, 0000 (1 November 1997); doi: 10.1117/12.295141
Proc. SPIE 3134, Hartmann sensors for optical testing, 0000 (1 November 1997); doi: 10.1117/12.295142
Poster Session
Proc. SPIE 3134, New interferometers for testing optics, 0000 (1 November 1997); doi: 10.1117/12.279130
Optical Testing
Proc. SPIE 3134, New methods for measuring wave aberrations of high-quality imaging systems over an extended image field, 0000 (1 November 1997); doi: 10.1117/12.295143
Proc. SPIE 3134, Tandem shearing interferometer with large shears for complete wavefront reconstruction, 0000 (1 November 1997); doi: 10.1117/12.279131
Proc. SPIE 3134, Interferogram acquisition using a high-frame-rate CCD camera, 0000 (1 November 1997); doi: 10.1117/12.295144
Proc. SPIE 3134, Vibration stabilization of a phase-shifting interferometer for large optics, 0000 (1 November 1997); doi: 10.1117/12.279132
Proc. SPIE 3134, Design of a 24-in. phase-shifting Fizeau interferometer, 0000 (1 November 1997); doi: 10.1117/12.295145
Proc. SPIE 3134, Errors caused by nearly parallel optical elements in a laser Fizeau interferometer utilizing strictly coherent imaging, 0000 (1 November 1997); doi: 10.1117/12.295146
Proc. SPIE 3134, IR interferometers using modern cameras, 0000 (1 November 1997); doi: 10.1117/12.295147
Measuring Material Properties
Proc. SPIE 3134, Fringe modulation characterization for a phase-shifting imaging ellipsometer, 0000 (1 November 1997); doi: 10.1117/12.295148
Proc. SPIE 3134, Laser interferometer for determination of refractive index and thickness, 0000 (1 November 1997); doi: 10.1117/12.279133
Proc. SPIE 3134, Stress measurement of deposited SiO2 films on a silicon wafer using dimensional-stability holographic interferometry test, 0000 (1 November 1997); doi: 10.1117/12.295149
Physical Measurements
Proc. SPIE 3134, Online measurement system for monitoring ring tool misalignments, 0000 (1 November 1997); doi: 10.1117/12.295150
Proc. SPIE 3134, Rigorous decision of the excess fraction method in absolute distance interferometry, 0000 (1 November 1997); doi: 10.1117/12.279134
Proc. SPIE 3134, Optical fiber superheterodyne interferometer with a two-wavelength HeNe laser for absolute distance inferometry, 0000 (1 November 1997); doi: 10.1117/12.279135
Poster Session
Proc. SPIE 3134, Application of LD-pumped Nd:YVO4 microchip laser for absolute distance measurement, 0000 (1 November 1997); doi: 10.1117/12.279136
System Testing
Proc. SPIE 3134, Study of the bimorph deformable mirror, 0000 (1 November 1997); doi: 10.1117/12.279137
Physical Measurements
Proc. SPIE 3134, Self-mixing type of phase-locked laser diode interferometer, 0000 (1 November 1997); doi: 10.1117/12.279138