Optical system test methods with photothermoplastic carrier

Lev M. Panasiuk; Serghey V. Psar

doi:10.1117/12.295126

1 November 1997 Optical system test methods with photothermoplastic carrier

Lev M. Panasiuk, Serghey V. Psar

Proceedings Volume 3134, Optical Manufacturing and Testing II; (1997) https://doi.org/10.1117/12.295126
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

Present paper reports the methods and the results of investigations of the optical system resolution. The limiting spatial frequencies are recorded on the photothermoplastic carriers (PTPC) in the real-time scale. The used PTPCs with a resonance frequency close to the expected boundary of the contrast-frequency response of an optical systems make it possible to record the images of different test-objects on the PTPC. This allows us to get the true data and rated values for the resolution both of the stock-produced lenses with the resolution about 300 to 500mm^-1 and the special ones with the resolution above 1000mm^-1.

Citation Download Citation

Lev M. Panasiuk and Serghey V. Psar "Optical system test methods with photothermoplastic carrier", Proc. SPIE 3134, Optical Manufacturing and Testing II, (1 November 1997); https://doi.org/10.1117/12.295126

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