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14 October 1997 Oxidation kinetics for metal-dielectric films using IR optical measurements
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The thermal oxidation of small metallic particles have been studied using infrared spectroscopy. The oxidation has been quantified by measuring the absorption of p-polarized light at 60 degree angle of incidence at the wavelengths around the longitudinal optical (LO) phonon mode of the created oxide. The case presented in this report is nickel rods embedded in alumina (Ni-Al2O3) exposed to temperatures in the range between 300 and 500 degrees Celsius from 1 to 500 hours. The rate of oxidation was found to be somewhat lower than previously reported for large particles and bulk nickel.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tuquabo Tesfamichael, Stefan K. Andersson, T. Chibuye, and Ewa Wackelgard "Oxidation kinetics for metal-dielectric films using IR optical measurements", Proc. SPIE 3138, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion XV, (14 October 1997);

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