Instrumentation for measuring NVIS displays: practical optimization for best performance

Richard Young; William E. Schneider

doi:10.1117/12.279234

26 September 1997 Instrumentation for measuring NVIS displays: practical optimization for best performance

Richard Young, William E. Schneider

Proceedings Volume 3140, Photometric Engineering of Sources and Systems; (1997) https://doi.org/10.1117/12.279234
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

Displays providing NVIS compatibility must meet exacting standards. Instruments to test these devices must also perform to set minimum requirements, given in MIL-L-85762A appendix B. Traditionally, these requirements have been difficult to achieve in practice, and then only by compromising measurement conditions. A combination of new technology and application- oriented optimization of the spectroradiometer has led to recent revolutionary changes in NVIS measurement instrumentation. The optimizations possible, the mechanisms of achieving these optimizations, and the impact of any differences on measurements are discussed for two commercial instruments.

Citation Download Citation

Richard Young and William E. Schneider "Instrumentation for measuring NVIS displays: practical optimization for best performance", Proc. SPIE 3140, Photometric Engineering of Sources and Systems, (26 September 1997); https://doi.org/10.1117/12.279234

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