PROCEEDINGS VOLUME 3141
OPTICAL SCIENCE, ENGINEERING AND INSTRUMENTATION '97 | 27 JULY - 1 AUGUST 1997
Scattering and Surface Roughness
IN THIS VOLUME

4 Sessions, 31 Papers, 0 Presentations
OPTICAL SCIENCE, ENGINEERING AND INSTRUMENTATION '97
27 July - 1 August 1997
San Diego, CA, United States
Surface Roughness and Surface Defects Detection
Proc. SPIE 3141, In-situ measurement of roughness spectra using diffuse scattering, 0000 (26 September 1997); https://doi.org/10.1117/12.287788
Proc. SPIE 3141, Application of circular and spherical statistics for the interpretation of BRDF measurements, 0000 (26 September 1997); https://doi.org/10.1117/12.287794
Proc. SPIE 3141, Scattering of electromagnetic waves from a one-dimensional random metal surface with a localized defect, 0000 (26 September 1997); https://doi.org/10.1117/12.279243
Proc. SPIE 3141, Sensitivity of far-field speckle pattern to the small local changes of the rough surface geometry, 0000 (26 September 1997); https://doi.org/10.1117/12.287802
Proc. SPIE 3141, Scanning laser method for measuring surface morphology, 0000 (26 September 1997); https://doi.org/10.1117/12.287803
Proc. SPIE 3141, Surface roughness in sputtered tin oxide films studied by light scattering and atomic force microscopy, 0000 (26 September 1997); https://doi.org/10.1117/12.287804
Proc. SPIE 3141, Quality assessment of supersmooth to rough surfaces by multiple-wavelength light scattering measurement, 0000 (26 September 1997); https://doi.org/10.1117/12.287805
Proc. SPIE 3141, Scattering from sinusoidal gratings, 0000 (26 September 1997); https://doi.org/10.1117/12.287806
Proc. SPIE 3141, Development of a smooth-surface microroughness standard, 0000 (26 September 1997); https://doi.org/10.1117/12.287807
Scattering Theory and Analysis
Proc. SPIE 3141, Dressed Rayleigh expansion for rough surface scattering, 0000 (26 September 1997); https://doi.org/10.1117/12.279235
Proc. SPIE 3141, Analysis of near-field optical image of a deterministic surface structure using an exact Rayleigh approach, 0000 (26 September 1997); https://doi.org/10.1117/12.287789
Proc. SPIE 3141, Scatter-probe near-field optical microscopy of metallic surfaces, 0000 (26 September 1997); https://doi.org/10.1117/12.287790
Proc. SPIE 3141, Transfer function characterization of scattering surfaces revisited, 0000 (26 September 1997); https://doi.org/10.1117/12.287791
Proc. SPIE 3141, Comparison of Harvey-Shack scatter theory with experimental measurements, 0000 (26 September 1997); https://doi.org/10.1117/12.287792
Proc. SPIE 3141, Enhanced backscattering of light from a randomly rough interface between a dipole-active medium and a dielectric, 0000 (26 September 1997); https://doi.org/10.1117/12.279236
Proc. SPIE 3141, Transverse correlation length for randomly rough surfaces: two-dimensional roughness, 0000 (26 September 1997); https://doi.org/10.1117/12.279237
Proc. SPIE 3141, Scattering by randomly rough two-dimensional dielectric surfaces, 0000 (26 September 1997); https://doi.org/10.1117/12.287793
Proc. SPIE 3141, Stokes matrix in conical scattering from a one-dimensional randomly rough metal surface, 0000 (26 September 1997); https://doi.org/10.1117/12.279238
Proc. SPIE 3141, Surface plasmon polaritons in light scattering from free-standing randomly rough thin metal films, 0000 (26 September 1997); https://doi.org/10.1117/12.279239
Instrumentation and Application
Proc. SPIE 3141, Design review of an in-situ bidirectional reflectometer, 0000 (26 September 1997); https://doi.org/10.1117/12.287795
Proc. SPIE 3141, Final design, assembly, and testing of a space-based total integrated scatter instrument, 0000 (26 September 1997); https://doi.org/10.1117/12.287796
Proc. SPIE 3141, Goniometric optical scatter instrument for bidirectional reflectance distribution function measurements with out-of-plane and polarimetry capabilities, 0000 (26 September 1997); https://doi.org/10.1117/12.279240
Proc. SPIE 3141, Memory effect in the double passage of waves through a one-dimensional random phase screen, 0000 (26 September 1997); https://doi.org/10.1117/12.287797
Proc. SPIE 3141, Speckle correlations in the light scattered and transmitted by dielectric and metal films with rough surfaces, 0000 (26 September 1997); https://doi.org/10.1117/12.287798
Proc. SPIE 3141, Memory effect from a one-dimensional rough dielectric film on a glass substrate, 0000 (26 September 1997); https://doi.org/10.1117/12.287799
Proc. SPIE 3141, Phenomenological BRDF modeling for engineering applications, 0000 (26 September 1997); https://doi.org/10.1117/12.287800
Poster Session
Proc. SPIE 3141, Green function for fluorescence from spherical particles located on a substrate, 0000 (26 September 1997); https://doi.org/10.1117/12.279241
Proc. SPIE 3141, Scanning scattering microscope for surface and buried interface roughness and defect imaging, 0000 (26 September 1997); https://doi.org/10.1117/12.279242
Proc. SPIE 3141, Scattering from planar surfaces with magnetic and thermal fluctuations, 0000 (26 September 1997); https://doi.org/10.1117/12.287801
Proc. SPIE 3141, Toward a model accounting for the impact of surface treatment on the performances of scintillation counters, 0000 (26 September 1997); https://doi.org/10.1117/12.279244
Instrumentation and Application
Proc. SPIE 3141, Calibration of optical components for the DS-1 space probe, 0000 (26 September 1997); https://doi.org/10.1117/12.279245
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