26 September 1997 Design review of an in-situ bidirectional reflectometer
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Abstract
Recently, Surface Optics Corporation has designed and manufactured a field portable bidirectional reflectometer that measures the bidirectional reflectance of samples in place without the need to take samples into the laboratory. The instrument consists of a measurement head, power supply box, and a PC. The measurement head weighs approximately sixty pounds and it contains the source, detector, stepper motors for varying the incident and reflected angles, and a filter wheel. All of these components are software controlled for measuring the BRDF of samples from 400 nm to 1100 nm (VIS-NIR configuration) or 3.0 micrometer to 12.0 micrometer (IR configuration) at incident polar angles of 0 to 60 degrees. The detector can map the BRDF of a sample from 0 to 85 degrees polar angle and 0 to 180 degrees in azimuth. The instrument configuration is reviewed and measured data presented on a blue krylon paint sample.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael T. Beecroft, Michael T. Beecroft, Phillip R. Mattison, Phillip R. Mattison, } "Design review of an in-situ bidirectional reflectometer", Proc. SPIE 3141, Scattering and Surface Roughness, (26 September 1997); doi: 10.1117/12.287795; https://doi.org/10.1117/12.287795
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