26 September 1997 Design review of an in-situ bidirectional reflectometer
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Abstract
Recently, Surface Optics Corporation has designed and manufactured a field portable bidirectional reflectometer that measures the bidirectional reflectance of samples in place without the need to take samples into the laboratory. The instrument consists of a measurement head, power supply box, and a PC. The measurement head weighs approximately sixty pounds and it contains the source, detector, stepper motors for varying the incident and reflected angles, and a filter wheel. All of these components are software controlled for measuring the BRDF of samples from 400 nm to 1100 nm (VIS-NIR configuration) or 3.0 micrometer to 12.0 micrometer (IR configuration) at incident polar angles of 0 to 60 degrees. The detector can map the BRDF of a sample from 0 to 85 degrees polar angle and 0 to 180 degrees in azimuth. The instrument configuration is reviewed and measured data presented on a blue krylon paint sample.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael T. Beecroft, Michael T. Beecroft, Phillip R. Mattison, Phillip R. Mattison, "Design review of an in-situ bidirectional reflectometer", Proc. SPIE 3141, Scattering and Surface Roughness, (26 September 1997); doi: 10.1117/12.287795; https://doi.org/10.1117/12.287795
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