26 September 1997 Scatter-probe near-field optical microscopy of metallic surfaces
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Abstract
The classical diffraction limit of conventional optical systems of image formation can be beaten in near field optical microscopy, and several schemes have been proposed for this purpose. Most of the arrangements employ a tapered optical waveguide to illuminate or/and collect the light reflected or transmitted by the sample. The resolution is, in this case, primarily determined by the size of the tip, and efforts are being made to produce sharper ones. An alternative technique that has also been considered consists of using scatterers in the near field of the sample under study. Although the interpretation of the images becomes more difficult, this technique appears promising for extending the current resolution of near-field optical microscopes. In this paper, we consider the problem of image formation in a near field scatter-probe optical microscope, applied to the visualization of metallic samples. In our study, the problem is approached with a combination of numerical and experimental techniques.
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Eugenio R. Mendez, Pedro Negrete-Regagnon, Saul Alonso Zavala Ortiz, Criseida Gonzalez-Rodriguez, "Scatter-probe near-field optical microscopy of metallic surfaces", Proc. SPIE 3141, Scattering and Surface Roughness, (26 September 1997); doi: 10.1117/12.287790; https://doi.org/10.1117/12.287790
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