26 September 1997 Scattering by randomly rough two-dimensional dielectric surfaces
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Abstract
An experimental investigation of the angular distribution of the light scattered by randomly rough, two-dimensional, isotropic dielectric surfaces is presented. The surfaces, whose profiles constitute good approximations to Gaussian random processes with Gaussian correlation functions are fabricated in photoresist and characterized by means of a mechanical profilometer. The substrates employed in the fabrication of the samples consist of thick parallel plates of filter glass that absorb the incident light and whose refractive index is close to that of photoresist. This allows us to approximate experimentally a situation in which the light is scattered by a randomly rough interface separating two semi-infinite dielectric media, illuminated from the air side. With the rougher surfaces, we have observed enhanced backscattering effects in both, the s and p cases of incident polarization. Small but important cross-polarized components of the scattered light have also been observed.
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Elena I. Chaikina, Elena I. Chaikina, Rafael Hernandez-Walls, Rafael Hernandez-Walls, Eugenio R. Mendez, Eugenio R. Mendez, "Scattering by randomly rough two-dimensional dielectric surfaces", Proc. SPIE 3141, Scattering and Surface Roughness, (26 September 1997); doi: 10.1117/12.287793; https://doi.org/10.1117/12.287793
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