Paper
24 October 1997 Fluorescent x-ray computed tomography to visualize specific material distribution
Tohoru Takeda, Tetsuya Yuasa, Atsunori Hoshino, Masahiro Akiba, Akira Uchida, Masahiro Kazama, Kazuyuki Hyodo, F. Avraham Dilmanian, Takao Akatsuka, Yuji Itai
Author Affiliations +
Abstract
Fluorescent x-ray computed tomography (FXCT) is being developed to detect non-radioactive contrast materials in living specimens. The FXCT systems consists of a silicon channel cut monochromator, an x-ray slit and a collimator for detection, a scanning table for the target organ and an x-ray detector for fluorescent x-ray and transmission x-ray. To reduce Compton scattering overlapped on the K(alpha) line, incident monochromatic x-ray was set at 37 keV. At 37 keV Monte Carlo simulation showed almost complete separation between Compton scattering and the K(alpha) line. Actual experiments revealed small contamination of Compton scattering on the K(alpha) line. A clear FXCT image of a phantom was obtained. Using this system the minimal detectable dose of iodine was 30 ng in a volume of 1 mm3, and a linear relationship was demonstrated between photon counts of fluorescent x-rays and the concentration of iodine contrast material. The use of high incident x-ray energy allows an increase in the signal to noise ratio by reducing the Compton scattering on the K(alpha) line.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tohoru Takeda, Tetsuya Yuasa, Atsunori Hoshino, Masahiro Akiba, Akira Uchida, Masahiro Kazama, Kazuyuki Hyodo, F. Avraham Dilmanian, Takao Akatsuka, and Yuji Itai "Fluorescent x-ray computed tomography to visualize specific material distribution", Proc. SPIE 3149, Developments in X-Ray Tomography, (24 October 1997); https://doi.org/10.1117/12.279355
Lens.org Logo
CITATIONS
Cited by 7 scholarly publications and 10 patents.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
X-rays

X-ray detectors

Iodine

Compton scattering

Sensors

Absorption

X-ray imaging

Back to Top