24 October 1997 High-resolution large-area high-energy x-ray tomography
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Abstract
An x-ray tomography system is being developed for high resolution inspection of large objects. The goal is to achieve 25 micron resolution over object sizes that are tens of centimeters in extent. Typical objects will be metal in composition and therefore high energy, few MeV x-rays will be required. A proof-of-principle system with a limited field of view has been developed. Preliminary results are presented.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James E. Trebes, James E. Trebes, Kenneth W. Dolan, Kenneth W. Dolan, Waleed S. Haddad, Waleed S. Haddad, Jerry J. Haskins, Jerry J. Haskins, Richard A. Lerche, Richard A. Lerche, Clinton M. Logan, Clinton M. Logan, Dwight E. Perkins, Dwight E. Perkins, Daniel J. Schneberk, Daniel J. Schneberk, Derrill Rikard, Derrill Rikard, "High-resolution large-area high-energy x-ray tomography", Proc. SPIE 3149, Developments in X-Ray Tomography, (24 October 1997); doi: 10.1117/12.292723; https://doi.org/10.1117/12.292723
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