Aberration analysis calculations for synchrotron radiation beamline design

Wayne R. McKinney; Malcolm R. Howells; Howard A. Padmore

doi:10.1117/12.292731

3 November 1997 Aberration analysis calculations for synchrotron radiation beamline design

Wayne R. McKinney, Malcolm R. Howells, Howard A. Padmore

Proceedings Volume 3150, Gratings and Grating Monochromators for Synchrotron Radiation; (1997) https://doi.org/10.1117/12.292731
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

The application of ray deviation calculations based on aberration coefficients for a single optical surface for the design of beamline optical systems is reviewed. A systematic development is presented which allows insight into which aberration may be causing the rays to deviate from perfect focus. A new development allowing analytical calculation of lineshape is presented.

Citation Download Citation

Wayne R. McKinney, Malcolm R. Howells, and Howard A. Padmore "Aberration analysis calculations for synchrotron radiation beamline design", Proc. SPIE 3150, Gratings and Grating Monochromators for Synchrotron Radiation, (3 November 1997); https://doi.org/10.1117/12.292731

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available