3 November 1997 Aberration analysis calculations for synchrotron radiation beamline design
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Abstract
The application of ray deviation calculations based on aberration coefficients for a single optical surface for the design of beamline optical systems is reviewed. A systematic development is presented which allows insight into which aberration may be causing the rays to deviate from perfect focus. A new development allowing analytical calculation of lineshape is presented.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wayne R. McKinney, Wayne R. McKinney, Malcolm R. Howells, Malcolm R. Howells, Howard A. Padmore, Howard A. Padmore, } "Aberration analysis calculations for synchrotron radiation beamline design", Proc. SPIE 3150, Gratings and Grating Monochromators for Synchrotron Radiation, (3 November 1997); doi: 10.1117/12.292731; https://doi.org/10.1117/12.292731
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