11 December 1997 X-ray diffraction studies of the performance of Si-TaSi2 single crystals as monochromators for synchrotron radiation
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Abstract
We have studied the diffraction properties of Si-TaSi2 single crystals as high flux x-ray monochromators in a wide range of x-ray energies from 4 keV to 80 keV on beamline 7-2 at the Stanford Synchrotron Radiation Laboratory. Uniform rocking curves with predominant Lorentzian shape were observed in symmetric Bragg geometry. The peak reflectivity of the (111) reflection varied between 25% and 69% and the full width at half height between 40 arcsec and 133 arcsec. Similar results were measured for the (220) reflection. An interesting possibility arises from the anisotropy of the material: the resolution and consequently the flux can be varied by a factor two or more by simply rotating the crystal in its diffraction plane. The gain factors measured ranged from 3.2 at 6 keV to 43 at 80 keV for the 111- reflection and from 2.3 at 6 keV up to 128 for 60 keV for the 220-reflection, respectively. The agreement with the theory based on the mosaic model was partly good, but generally unsatisfactory.
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Andreas K. Freund, Anneli Munkholm, Stuart R. Stock, Zofia U. Rek, "X-ray diffraction studies of the performance of Si-TaSi2 single crystals as monochromators for synchrotron radiation", Proc. SPIE 3151, High Heat Flux and Synchrotron Radiation Beamlines, (11 December 1997); doi: 10.1117/12.294488; https://doi.org/10.1117/12.294488
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