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16 October 1997 Infrared microspectroscopy with synchrotron radiation
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Abstract
Infrared microspectroscopy with a high brightness synchrotron source can achieve a spatial resolution approaching the diffraction limit. However, in order to realize this intrinsic source brightness at the specimen location, some care must be taken in designing the optical system. Also, when operating in diffraction limited conditions, the effective spatial resolution is no longer controlled by the apertures typically used for a conventional (geometrically defined) measurement. Instead, the spatial resolution depends on the wavelength of light and the effective apertures of the microscope's Schwarzchild objectives. We have modeled the optical system from the synchrotron source up to the sample location and determined the diffraction-limited spatial distribution of light. Effects due to the dependence of the synchrotron source's numerical aperture on wavelength, as well as the difference between transmission and reflection measurement modes, are also addressed. Lastly, we examine the benefits (when using a high brightness source) of an extrinsic germanium photoconductive detector with cone optics as a replacement for the standard MCT detector.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
G. Lawrence Carr and Gwyn P. Williams "Infrared microspectroscopy with synchrotron radiation", Proc. SPIE 3153, Accelerator-Based Infrared Sources and Applications, (16 October 1997); https://doi.org/10.1117/12.290262
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