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1 November 1997 High-resolution phase contrast microscopy with a hard x-ray waveguide
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Abstract
High energy x-ray phase contrast experiment with an unprecedent resolution is shown. The coherent and divergent submicron beam from an x-ray waveguide is used to realize a lensless microscope and to magnify spatial variations in optical path length 500 times or more. The defocused image of a nylon fiber with a resolution of 0.14 micron is presented. Exposure times as short as 0.1 seconds gave already visible contrast, opening the way to high resolution, real time studies.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alessia Cedola, Peter Cloetens, Silvia Di Fonzo, Werner H. Jark, Stefano Lagomarsino, G. Soullie, and Christian Riekel "High-resolution phase contrast microscopy with a hard x-ray waveguide", Proc. SPIE 3154, Coherent Electron-Beam X-Ray Sources: Techniques and Applications, (1 November 1997); https://doi.org/10.1117/12.279388
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