1 November 1997 Production and characterization of x-ray speckle at Sector 8 of the advanced photon source
Author Affiliations +
Abstract
We have implemented in the undulator first-optics enclosure of the Massachusetts Institute of Technology-McGill University-IBM Corporation Collaborative Access Team Sector at the Advanced Photon Source an x-ray beamline and a spectrometer optimized for performing small-angle, wide- bandpass, coherent x-ray scattering experiments. We describe the novel features of this set-up. The performance of the beamline and the spectrometer has been characterized by measuring static x-ray speckle patterns form isotopically disordered aerogels. Statistical analysis of the speckle patterns has been performed from which we extract the speckle width sand contrast versus wave-vector transfer and sample thickness. The measured speckle widths and contrast are compared to direct numerical evaluations of the intensity correlation function. The calculated widths are in poor agreement with the measurements but the calculated contrast agrees well with the measured contrast.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alec R. Sandy, L. B. Lurio, S. G. J. Mochrie, A. Malik, G. Brian Stephenson, Mark Sutton, "Production and characterization of x-ray speckle at Sector 8 of the advanced photon source", Proc. SPIE 3154, Coherent Electron-Beam X-Ray Sources: Techniques and Applications, (1 November 1997); doi: 10.1117/12.293368; https://doi.org/10.1117/12.293368
PROCEEDINGS
12 PAGES


SHARE
KEYWORDS
X-rays

Speckle

Scattering

Speckle pattern

Sensors

Charge-coupled devices

Laser scattering

Back to Top