Transient inversion XUV-lasers in Ti and Ge

Peter Viktor Nickles; Matthias Schnuerer; Mikhail P. Kalachnikov; Wolfgang Sandner; Vyacheslav N. Shlyaptsev; Colin N. Danson; David Neely; E. Wolfrum; Jie Zhang; A. Behjat; A. Demir; Gregory J. Tallents; P. J. Warwick; Ciaran L. S. Lewis

doi:10.1117/12.279405

1 November 1997 Transient inversion XUV-lasers in Ti and Ge

Peter Viktor Nickles, Matthias Schnuerer, Mikhail P. Kalachnikov, Wolfgang Sandner, Vyacheslav N. Shlyaptsev, Colin N. Danson, David Neely, E. Wolfrum, Jie Zhang, A. Behjat, A. Demir, Gregory J. Tallents, P. J. Warwick, Ciaran L. S. Lewis

Author Affiliations +

Proceedings Volume 3156, Soft X-Ray Lasers and Applications II; (1997) https://doi.org/10.1117/12.279405
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

Low pump energy transient gain x-ray lasers in Ti at 32.6 nm, 30.15 nm, in V at 30.4 nm and Ge at 19.6 nm using picosecond pulse heating of a long pulse preformed plasma of neonlike ions has been realized for the first time. Gain saturation was demonstrated in Ti and Ge XRL. Results of pump consumption, x- ray divergence and output energy are given.

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Peter Viktor Nickles, Matthias Schnuerer, Mikhail P. Kalachnikov, Wolfgang Sandner, Vyacheslav N. Shlyaptsev, Colin N. Danson, David Neely, E. Wolfrum, Jie Zhang, A. Behjat, A. Demir, Gregory J. Tallents, P. J. Warwick, and Ciaran L. S. Lewis "Transient inversion XUV-lasers in Ti and Ge", Proc. SPIE 3156, Soft X-Ray Lasers and Applications II, (1 November 1997); https://doi.org/10.1117/12.279405

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